Dinglong won the Best Presentation Award (Merit) on the Faculty Postgraduate Research Day 2026. Congratulations!

Dinglong won the Best Presentation Award (Merit) on the Faculty Postgraduate Research Day 2026. Congratulations!

Yuang Fu won the Best Talk Prize at the European Materials Research Society (E-MRS) Spring Meeting 2026, France. Congratulations!


The presence of non-perovskite δ-phase at the buried interface between the perovskite active layer and the charge transport layer significantly hinders the commercialization of perovskite solar cells. This is primarily due to the difficulty in detecting it during the initial device fabrication. This unwanted phase acts as a nucleation site for degradation and is notoriously difficult to eliminate once formed.… Read More
The random distribution of shunt resistance in organic photovoltaics (OPVs) compromises device performance and reproducibility, particularly under low-light conditions, which are typical operation conditions of Ambient Internet of Things (A-IoT) applications. In this work, we identify the morphological origin of shunt resistance and introduce a universally applicable strategy to mitigate it in both OPV devices and mini-modules.… Read More
On Apr 22nd, 2026, Luhang Xu successfully passed the defense! Congratulations, Dr. Xu!

On Nov 3rd, 2025, Pok Fung Chan successfully passed the defense! Congratulations, Dr. Chan!

Jing Yan, Yingjian He and Zhongyan Hu join our group as graduate students majoring in MSE.
On May 2oth, 2025, Heng Liu successfully passed the defense! Congratulations, Dr. Liu!

Luhang won the best poster award at the MRS spring meeting 2025. Congratulations!


The complex structure within the photoactive layer of organic photovoltaics (OPVs) makes it challenging to establish a clear structure-performance relationship. In this study, we investigate the morphological origins of performance limitations in OPVs, with a particular focus on deep-trap-assisted monomolecular recombination. Through advanced morphological and device-physics characterization techniques, we identify isolated crystalline and amorphous acceptor domains as primary sources of deep electron traps, due to the substantial LUMO offset between donor and acceptor materials employed in high-performance OPVs.… Read More