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[1994
- 2001] |
2001 |
|
(11)
J. F. Wang, M. S.
Gudiksen, X. F. Duan, Y. Cui, C. M. Lieber,* “Highly
polarized photoluminescence and photodetection from single indium
phosphide nanowires”, Science 293: 1455-1457 (2001). [PDF]
(10)
M.
S. Gudiksen, J. F. Wang, C. M. Lieber,* “Synthetic control of
the diameter and length of single crystal semiconductor nanowires”, J.
Phys. Chem. B 105: 4062-4064 (2001). [PDF]
(9) Y.
Cui, L.
J. Lauhon, M. S. Gudiksen, J. F. Wang, C. M. Lieber,*
“Diameter-controlled synthesis of single-crystal silicon nanowires”,
Appl. Phys. Lett. 78: 2214-2216 (2001). [PDF]
(8) X.
F. Duan, Y. Huang, Y. Cui, J. F. Wang, C. M. Lieber,* “Indium
phosphide nanowires as building blocks for nanoscale electronic and
optoelectronic devices”, Nature 409: 66-69 (2001). [PDF]
|
2000 |
|
(7)
X.
F. Duan, J. F. Wang, C. M. Lieber,* “Synthesis and optical
properties of gallium arsenide nanowires”, Appl. Phys. Lett. 76:
1116-1118 (2000).
(6)
W.
L. Li,* G. D. Ascenzo, R. Curini, C. H. Yan, J. F. Wang, J. J.
Tao, M. W. Wang, “Simulation of the development automatization
control system for rare earth extraction process – combination of
ESRECE simulation software and EDXRF analysis technique”, Anal.
Chim. Acta 417: 111-118 (2000). |
1999 |
|
(5)
J.
F. Wang, K. C. Rose, C. M. Lieber,* “Load-independent friction:
MoO3 nanocrystal lubricants”, J. Phys. Chem. B 103:
8405-8409(1999).
(4)
J.
T. Jia, J. F. Wang, C. H. Yan,* C. S. Liao, S. Wu, B. G. Li,
“Calculation of extraction equilibrium in multi-component system by
Newton-Raphson algorithm”, J. Rare Earths 17: 246-249
(1999). |
1996 |
|
(3)
C.
H. Yan,* Y. W. Zhang, C. S. Liao, J. T. Jia, J. F. Wang, B. G.
Li, “Application of the phase transfer catalysis in rare earth
solvent extraction”, J. Rare Earths 14: 88-93 (1996).
(2)
Y.
W. Zhang, S. Gao, C. H. Yan,* J. F. Wang, B. G. Li, C. H. Huang,
G. X. Xu, “Electronic structures of [Ln(NO3)x(NCS)y]n-
(Ln =
La, Nd, Er)”, J. Alloys and Compd. 233: 52-55 (1996).
|
1994
|
|
(1)
T.
Z. Cheng,* J. F. Wang, Z. H. Wan, B. D. Sha, “EDIM93: a
program for electron diffraction intensity measurement from
photographic data”, J. Appl. Crystallogr. 27: 430-432
(1994).
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